Find a research partner or other support function connected to the large scale research facilities,
ESS & MAX IV. If you are not ready or not sure what you are looking for start here.
Are you curious about nanoscale morphology of your material? We offer characterization on nanoscale level of materials by SAXS/WAXS/GISAXS* measurements. SAXS is capable of delivering structural information of dimensions between 1 and 100 nm. The method is accurate, non-destructive and usually requires only a minimum of sample preparation. WAXS like XRD provides the information of crystalline structure, e.g. lattice constant and symmetry and crystallinity. GISAXS is used to study nanostructured surfaces and thin films. Do you plan to do advanced X-ray scattering studies? SAXSpoint 2.0 from Anton Paar delivers analysis of nanostructured materials close to synchrotron level. Sample holders for: liquids, solids, powders and thin films. * Small-Angle X-ray Scattering (SAXS), Wide-Angle X-ray Scattering (WAXS) and Grazing-Incidence Small Angle X-ray Scattering (GISAXS).
We offer SAXS/WAXS/GISAXS measurements on nanostructured material on our SAXSpoint laboratory beamline. Contact us for research collaborations and consultations.
