Are you curious about nanoscale morphology of your material? We offer characterization on nanoscale level of materials by SAXS/WAXS/GISAXS* measurements. SAXS is capable of delivering structural information of dimensions between 1 and 100 nm. The method is accurate, non-destructive and usually requires only a minimum of sample preparation. WAXS like XRD provides the information of crystalline structure, e.g. lattice constant and symmetry and crystallinity. GISAXS is used to study nanostructured surfaces and thin films. Do you plan to do advanced X-ray scattering studies? SAXSpoint 2.0 from Anton Paar delivers analysis of nanostructured materials close to synchrotron level. Sample holders for: liquids, solids, powders and thin films. * Small-Angle X-ray Scattering (SAXS), Wide-Angle X-ray Scattering (WAXS) and Grazing-Incidence Small Angle X-ray Scattering (GISAXS).